Electro-Migration in a Xerox Alto
by londons_explore on 1/29/2019, 7:39:08 AM
Electromigration is a major cause for failures of silicon components.
Over many years, metal in the very tiny vias between metal layers in the chip fail.
by white-flame on 1/29/2019, 9:16:19 PM
Tangential, but is the spelling "buss rail" used in any widespread sense? Buss is affection, bus is shared transport.
Electromigration is a major cause for failures of silicon components.
Over many years, metal in the very tiny vias between metal layers in the chip fail.